Interfacial Properties

=>Back to Physics.html
=>Back to Beaucage Home Page.

Interfacial Properties of Polymers/Reflectivity:
Collaboration with AFRL
Students Involved: Mike Banach, undergraduate reasearch.
banachmj@email.uc.edu

IF1: Neutron Reflectivity Studies of End-Grafted Polymers, Mansfield, T. L.; Iyengar, D. R.; Beaucage, G.; McCarthy, T. J.; Stein, R. S.; Composto, R. J., Macromolecules (1995), 28(2), 492-9.
IF2: The volume fraction profile of terminally adsorbed polymers, Composto, R. J.; Mansfield, T.; Beaucage, G.; Stein, R. S.; Iyengar, D. R.; Mc Carthy, T. J.; Satija, S. K.; Ankner, J. F.; Majkrzak, C. F., Mater. Res. Soc. Symp. Proc. (1992), 248(Complex Fluids), 407-12.
IF3: Ellipsometric study of the glass transition and thermal expansion coefficients of thin polymer films, Beaucage, G.; Composto, R.; Stein, R. S., J. Polym. Sci., Part B: Polym. Phys. (1993), 31(3), 319-26.
IF4: Neutron reflectivity study of concentration profile of polystyrene polymer brushes, Satija, S. K.; Ankner, J. F.; Majkrzak, C. F.; Mansfield, T.; Beaucage, G.; Stein, R. S.; Iyengar, D. R.; McCarthy, T. J.; Composto, R. J., Polym. Mater. Sci. Eng. (1992), 67, 159-60.
IF5: Investigation of Porous Thin Films and Membranes using X-ray Reflection Isotherm, D.-W. Hua, G. Beaucage, submitted J. Mat. Res. 1997.
IF6: "From small angle x-ray scattering to reflectivity: instrumentation and sample study", Hua, D. W.; Beaucage, G.; Kent, M. S., J. Mater. Res. (1996), 11(2), 273-6.
IFProp7: Internal Proposal on Incidental Evanescent Wave Small Angle Scattering (IEWSAS) G. Beaucage and W. Hamilton (ORNL). Included for reference.

1) Ellipsometry. Early work aimed at investigating the effect of layer thickness on the glass transition temperature of thin films showed a strong relationship in PS [IF3]. We are currently working with Airforce Research Lab on characterization of non-linear optical materials using variations on this approach (Mike Banach)

2) Neutron/x-ray reflectivity. Model system studies of controlled molecular topology at interfaces [IF1, 2, 4].

3) Rough Interface Studies. We have been working for several years on a successful approach to describe scattering from rough surfaces through an analysis of high resolution reflection data using Argonne 2-D detectors (4096x4096 resolution) [IFProp7]. A manuscript is in preparation with Bill Hamilton at ORNL and a talk was given at an APS meeting on this work. The approach is based on a combination of reflectivity and small-angle scattering. The systems studied were etched silicon and sol-gel based silica layers.